Support - Publications

Publications related to our products (starting with recent ones, going backwards in time):

  • Structure, optical properties and thermal stability of Al2O3-WC nanocomposite ceramic spectrally selective solar absorbers
    Xiang-Hu Gao, Cheng-Bing Wang, Zhi-Ming Guo, Qing-Fen Geng, Wolfgang Theiss, Gang Liu
    Optical Materials 58 (2016) 219-225

  • Charge Transfer at Organic/Inorganic Interfaces and the Formation of Space Charge Regions Studied with Infrared Light
    Sebastian Beck, David Gerbert, Tobias Glaser, and Annemarie Pucci
    J. Phys. Chem. C 2015, 119, 12545-12550

  • Surface-Enhanced Infrared Spectroscopy Using Nanometer-Sized Gaps
    Christian Huck, Frank Neubrech, Jochen Vogt, Andrea Toma, David Gerbert, Julia Katzmann, Thomas Haertling, and Annemarie Pucci
    ACS Nano, 2014, 8 (5), pp 4908–4914

  • IR spectroscopic studies of charge transfer in organic semiconductors
    Sebastian Beck, David Gerbert, Christian Krekeler, Tobias Glaser, Annemarie Pucci
    Proc. of SPIE Vol. 9137 91370T-1

  • Novel Mo-Si3N4 based selective coating for high temperature concentrating solar power applications
    E. Céspedes, M. Wirz, J. A. Sánchez-García, L. Álvarez-Fraga, R. Escobar and C. Prieto
    Sol. Energ. Mat. Sol. Cells, 122, 217 (2014)

  • Dielectric properties of the silver–copper alloy films deposited by magnetron sputtering
    Guang Yang, Xiaojian Fu, Ji Zhou
    JOSA B, Vol. 30, Issue 2, pp. 282-287 (2013)
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  • Spectral response of nanocrystalline ZnO films embedded with Au nanoparticles
    Anuradha Patra, A. Manivannan, S. Kasiviswanathan
    JOSA B, Vol. 29, Issue 12, pp. 3317-3324 (2012)
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  • Nanostructured porous silicon films for terahertz optics
    Riley M, Redo-Sanchez A, Karampourniotis P, Plawsky J, Lu TM.
    Nanotechnology. 2012 Aug 17;23(32):325301. doi: 10.1088/0957-4484/23/32/325301. Epub 2012 Jul 17.
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  • Photocatalytic Properties of Porous Titania Grown by Oblique Angle Deposition
    Riley, M. J., Williams, B., Condon, G. Y., Borja, J., Lu, T.-M., Gill, W. N., & Plawsky, J. L.
    Journal of Applied Physics, 111(7), 8. (2012).
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  • Determining the nonparabolicity factor of the CdO conduction band using indium doping and the Drude theory
    Rueben J Mendelsberg, Yuankun Zhu and Andre Anders
    J. Phys. D: Appl. Phys. 45 (2012) 425302 (7pp)
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  • Modeling of silicon nanocrystals based down-shifter for enhanced silicon solar cell performance
    F. Sgrignuoli, G. Paternoster, A. Marconi, P. Ingenhoven, A. Anopchenko, G. Pucker, L. Pavesi
    J. Appl. Phys. 111, 034303 (2012)
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  • The Temperature-Dependent Decomposition of SiO Studied by Infrared Vibrational Spectroscopy
    Steffen Wetzel, Markus Klevenz, Annemarie Pucci, Hans-Peter Gail
    Applied Spectroscopy, Vol. 66, Issue 9, pp. 1061-1066 (2012)
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  • Modeling of silicon nanocrystals based down-shifter for enhanced silicon solar cell performance
    F. Sgrignuoli, G. Paternoster, A. Marconi, P. Ingenhoven, A. Anopchenko, G. Pucker, L. Pavesi
    J. Appl. Phys. 111, 034303 (2012)
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  • Optical characterization of Copper Oxide thin films prepared by reactive dc magnetron sputtering for solar cell applications
    Mugwang’a F.K, Karimi P.K, Njoroge W.K, Omayio O2, Waita S.M
    (2012)
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  • Electric-field controllable optical activity in the nano-segregated system composed of rod- and bent-core liquid crystals [Invited]
    Fumito Araoka, Go Sugiyama, Ken Ishikawa, and Hideo Takezoe
    Optical Materials Express, Vol. 1, Issue 1, pp. 27-35 (2011
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  • Surface-enhanced ATR-IR spectroscopy with interface-grown plasmonic gold-island films near the percolation threshold
    Dominik Enders , Tadaaki Nagao , Annemarie Pucci , Tomonobu Nakayama and Masakazu Aono
    Phys. Chem. Chem. Phys., 2011,13, 4935-4941
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  • Spectral density analysis of the optical properties of Ni-Al2O3 nano-composite films
    Gunnar A. Niklasson, Tobias K. Boström, Enis Tuncer
    (2011)
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  • Bioconjugate functionalization of thermally carbonized porous silicon using a radical coupling reaction
    Beniamino Sciacca, Sara D. Alvarez, Francesco Geobaldo, Michael J. Sailor
    (2010)
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  • Effect of H-induced microstructural changes on pressure-optical transmission isotherms for MgeV thin films
    Marta Gonzalez-Silveira, R. Gremaud, A. Baldi, H. Schreuders, B. Dam, R. Griessen
    International journal of hydrogen energy xxx (2010) 1e12
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  • Evaporation and Condensation of SiO and SiO2 Studied by Infrared Spectroscopy
    M. KLEVENZ, S. WETZEL, M. MÖLLER, A. PUCCI
    (2010)
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  • Evaluation of the Thickness in Nanolayers Using the Transfer Matrix Method for Modeling the Spectral Reflectivity
    Juan E. González-Ramírez, Juan Fuentes, Luis C. Hernández, Luís Hernández
    Research Letters in Physics Volume 2009 (2009), Article ID 594175
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  • Carbon-in-silica composite selective solar absorbers: a determination of composition and dielectric properties
    G. Katumba ; A. Forbes
    Proc. SPIE 7410, Optical Modeling and Measurements for Solar Energy Systems III, 74100G (August 20, 2009)
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  • Modeling of optical and electrical properties of In2O3: Sn coatings made by various techniques
    A. Solieman, M.A. Aegerter
    (2009)
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  • Carbon-in-silica composite selective solar absorbers: a determination of composition and dielectric properties
    G. Katumba, A .Forbes
    (2009)
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  • Optical Properties of Sputter Deposited Transparent and Conducting TiO2:Nb Films
    C. M. Maghanga, G. A. Niklasson, C. G. Granqvist
    (2009)
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  • Evaluation of the Thickness in Nanolayers Using the Transfer Matrix Method for Modeling the Spectral Reflectivity
    Juan E. González-Ramírez, Juan Fuentes, Luis C. Hernández, Luís Hernández
    Research Letters in Physics, Volume 2009 (2009), Article ID 594175
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  • Destabilization of the Mg-H System through Elastic Constraints
    A. Baldi, M. Gonzalez-Silveira, V. Palmisano, B. Dam, R. Griessen
    Physical Review Letters 102, 226102 (2009)
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  • OPTICAL TRANSITION OF POROUS SILICON PREPARED AT DIFFERENT ANODIZATION TEMPERATURES
    LIKUN PAN, HAIBO LI,, ZHUO SUN, CHANGQING SUN
    Surface Review and Letters, Vol. 16, No. 3 (2009) 351–354
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  • Optical properties of carbonaceous nanoparticles produced in sputtering discharges
    A. Zeinert, C. Arnas, C. Dominique, and A. Mouberi
    J. Vac. Sci. Technol. A 26, 1450 (2008)
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  • Analysis of Chemical Signals from Complex Oceanic Gas Hydrate Ecosystems with infrared spectroscopy
    Gary T. Dobbs
    (2007)
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  • Influence of working pressure on properties of titanium oxide thin films at room temperature
    Z. W. Zhao, B. K. Tay
    J. Appl. Phys. 101, 013505 (2007)
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  • Investigation of zirconium oxynitride thin films deposited by reactive pulsed magnetron sputtering
    S H Mohamed, A M Abd El-Rahman and Mahrous R Ahmed
    S H Mohamed et al 2007 J. Phys. D: Appl. Phys. 40 7057
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  • Isotopic disorder effect in the infrared re?ection spectra of 6Lix7Li1-xYF4 single crystals
    E.A. Vinogradov, V.A. Yakovlev, N.N. Novikova, M.N. Popova, S.K. Saikin, B.Z. Malkin
    Solid State Communications 142 (2007) 256–260
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  • Gasochromic switching of reactively sputtered molybdenumoxide films: A correlation between film properties and deposition pressure
    Okumu, J. Koerfer, F., Salinga, C., Pedersen, T.P., Wutting, M.
    Thin Solid Films, Volume 515, issue 4 (December 5, 2006), p. 1327-1333.
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  • Experimental observation of photonic and polaritonic gaps in a silica opal
    Herman Högström, Carl G. Ribbing
    Applied Optics, Vol. 45, Issue 29, pp. 7617-7621 (2006)
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  • Graded SiOxNy layers as antireflection coatings for solar cells application
    M. LIPINSKI, S. KLUSKA, H. CZTERNASTEK, P. ZIEBA
    Materials Science-Poland, Vol. 24, No. 4, 2006
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  • Dielectric modeling of transmittance spectra of thin ZnO:Al films
    Zhaohui Qiao, Chitra Agashe, Dieter Mergel
    Thin Solid Films 496 (2006) 520 – 525
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  • Adhesion, Current Research and Applications
    Wulff Possart
    WILEY_VCH Verlag GmbH & Co. KGaA Weinheim, Germany (2005)
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  • Band-gap expansion, core-level shift, and dielectric suppression of porous silicon passivated by plasma ?uorination
    L. K. Pan, Y. K. Ee, C. Q. Sun, G. Q. Yu, Q. Y. Zhang, and B. K. Tay
    American Vacuum Society(2004)
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  • Distinguishing the effect of surface passivation from the effect of size on the photonic and electronic behavior of porous silicon
    L. K. Pan, Chang Q. Sun, G. Q. Yu, Q. Y. Zhang, Y. Q. Fu, and B. K. Tay
    Journal of Applied Physics, Volume 96, Number 3 (2004)
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  • Coordination imperfection enhanced electron-phonon interaction
    L. K. Pan and Chang Q. Sun
    Journal of Applied Physics, Volume 95, Number 7 (2004)
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  • Oxygen lone-pair states near the valence band edge of aluminum oxide thin ?lms
    Z. W. Zhao, B. K. Tay, Chang Q. Sun, and V. Ligatchev
    Journal of Applied Physics, Volume 95, Number 8 (2004)
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  • Oxygen lone-pair states near the valence band edge of aluminum oxide thin films
    Z. W. Zhao, B. K. Tay, Chang Q. Sun, V. Ligatchev
    J. Appl. Phys. 95, 4147 (2004
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  • Distinguishing the effect of surface passivation from the effect of size on the photonic and electronic behavior of porous silicon
    L. K. Pan, Chang Q. Sun, G. Q. Yu, Q. Y. Zhang, Y. Q. Fu, B. K. Tay
    J. Appl. Phys. 96, 1704 (2004);
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  • Band-gap expansion, core-level shift, and dielectric suppression of porous silicon passivated by plasma fluorination
    L. K. Pan, Y. K. Ee, C. Q. Sun, G. Q. Yu, Q. Y. Zhang, and B. K. Tay
    J. Vac. Sci. Technol. B 22, 583 (2004)
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  • Study of the structure and optical properties of nanocrystalline zirconium oxide thin films deposited at low temperatures
    Z W Zhao, B K Tay, L Huang and G Q Yu
    Z W Zhao et al 2004 J. Phys. D: Appl. Phys. 37 1701
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  • Room-Temperature Deposition of Amorphous Titanium Dioxide Thin Film with High Refractive Index by a Filtered Cathodic Vacuum Arc Technique
    Zhiwei Zhao, Beng Kang Tay, Guoqing Yu
    Applied Optics, Vol. 43, Issue 6, pp. 1281-1285 (2004)
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  • A systematic study of the anisotropic optical properties of thin poly(3- octylthiophene)-films in dependence on growth parameters
    Uladzimir Zhokhavets, Gerhard Gobsch, Harald Hoppe, Niyazi Serdar Sariciftci
    Thin Solid Films 451 – 452 (2004) 69–73
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  • Coordination imperfection enhanced electron-phonon interaction
    L. K. Pan, Chang Q. Sun
    J. Appl. Phys. 95, 3819 (2004)
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  • An automated directional reflectanceytransmittance analyser for coating analysis
    P.A. van Nijnatten
    Thin Solid Films 442 (2003) 74–79
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  • Non-contact measurement of conductivity during growth of metal ultrathin films
    G. Fahsold, A. Priebe, N. Magg, A. Pucci
    Thin Solid Films 428 (2003) 107–110
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  • Correlation between structure, stress and optical properties in direct current sputtered molybdenum oxide films
    S.H. Mohamed, O. Kappertz, J.M. Ngaruiya, T.P. Leervad Pedersen, R. Drese, M. Wuttig
    Thin Solid Films 429 (2003) 135–143
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  • Spectral Color Prediction by Advanced Physical Modelling of Toner, Ink and Paper, with Application to Halftoned Prints
    Gerben van Oosterhout, Wolfgang Theiss
    Proc. of the International Conference on Digital Printing Technologies IS&T's NIP19, 2003 , Volume 19, 797-802

  • Structural and optical properties of thin zirconium oxide films prepared by reactive direct current magnetron sputtering
    S. Venkataraj, Oliver Kappertz, Hansjörg Weis, Robert Drese, R. Jayavel, Matthias Wuttig
    J. Appl. Phys. 92, 3599 (2002)
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  • Temperature stability of sputtered niobium–oxide films
    S. Venkataraj, R. Drese, Ch. Liesch, O. Kappertz, R. Jayavel, M. Wuttig
    J. Appl. Phys. 91, 4863 (2002)
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  • Growth and characterization of zirconium oxynitride films prepared by reactive direct current magnetron sputtering
    S. Venkataraj, O. Kappertz, R. Jayavel, M. Wuttig
    J. Appl. Phys. 92, 2461 (2002)
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  • Structural and optical properties of thin lead oxide films produced by reactive direct current magnetron sputtering
    S. Venkataraj, Jean Geurts, Hansjörg Weis, Oliver Kappertz, Walter K. Njoroge, R. Jayavel, Matthias Wuttig
    J. Vac. Sci. Technol. A 19, 2870 (2001)
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  • Simultaneous Evaluation of Molecular-Orientation and Optical Parameters in Ultrathin Films by Oscillator-Model Simulation and Infrared External Reflection Spectrometry
    Takeshi Hasegawa, Jujiro Nishijo, Junzo Umemura, Wolfgang Theiß
    J. Phys. Chem. B 2001, 105, 11178-11185

  • Surface-Enhanced Infrared Absorption of CO on Platinized Platinum
    A.E.Bjerke, P.R.Griffiths, W. Theiß
    Anal. Chem. , 71 (1999), 1967-1974

  • Infrared analysis of thin films deposited on rough and curved substrates
    J.Valk, S.van Enckevort, W.Theiß
    AIP conference proceedings 430 (1998), 647

  • Much without touch – conditions for surface enhanced infrared absorption
    W.Theiß, R.Detemple, F.Ozanam
    AIP conference proceedings 430 (1998), 586

  • Wait and watch – monitoring photoresist thin films during heat treatment
    S.Hilbrich, W.Theiß, R.Carpio
    AIP conference proceedings 430 (1998), 463

  • Suppresion of ageing effects in porous silicon interference
    M. Krüger, S. Hilbrich, M. Thönissen, D.Scheyen, W. Theiß, H. Lüth
    Optics Communications 146 (1998), 309-315

  • Improved Interference Filter Structures Made of Porous Silicon
    Thoenissen, M. Berger, M. G. Krueger, M. Theiss, W. Hilbrich, S. Arens-Fischer, R. Billat, S. Lueth, H.
    MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDING, 1997, VOL 452, 643-648

  • Microoptical Devices based on Porous Silicon
    M.G.Berger, M.Thönissen, W.Theiß, H.Münder
    in ‘Structural and Optical Properties of Porous Silicon Nanostructures’, ed. By G.Amato, C.Delerue and H.J. von Bardeleben, Gordon&Breach (1997), 557-595 (invited)

  • Aging of porous silicon studied by optical reflection spectroscopy and other techniques
    W.Theiß, S.Hilbrich, R.Arens-Fischer, M.G.Berger, H.Münder
    in ‘Structural and Optical roperties of Porous Silicon Nanostructures’, ed. by G.Amato, C.Delerue and H.J. von Bardeleben, Gordon&Breach (1997), 451-482 (invited)

  • Refractive Index
    W.Theiß, S.Hilbrich
    a section (6 pages) in “Properties of Porous Silicon“, ed. by L.Canham, emis DATAREVIEWS SERIES No. 18 (1997), (invited)

  • Optical properties of porous silicon
    W. Theiß
    Surface Science Reports 29 (1997), 91-192 (Habilitation thesis)

  • The application of porous silicon interference filters in optical sensors
    S.Hilbrich, W.Theiß, R. Arens-Fischer, M.G.Berger, M.Krüger, M.Thönissen
    Thin Solid Films 297 (1997), 250-253

  • Dielectric filters made of PS: advanced performance by oxidation and new layer structures
    M.G.Berger, R. Arens-Fischer, M.Thönissen, S.Billat, H. Lüth, S.Hilbrich, W.Theiß, P.Grosse
    Thin Solid Films 297 (1997), 237-240

  • Analysis of the depth homogeneity of p-PS by reflectance measurements
    M.Thönissen, M.G.Berger, S.Billat, R. Arens-Fischer, M.Krüger, H. Lüth, W.Theiß, S.Hilbrich, P.Grosse, G.Lerondel, U.Frotscher
    Thin Solid Films 297 (1997), 92-96

  • Surface-enhanced infrared absorption spectroscopy (SEIRA) using multireflection ATR-elements
    H.D.Wanzenböck, B.Edl-Mizaikoff, G.Friedbacher, M.Grasserbauer, R.Kellner, M.Arntzen, T.Luyven, W.Theiß and P.Grosse
    Mikrochim. Acta [Suppl.] 14 (1997), 665-667

  • Numerical Simulation of IR-Spectroscopic Experiments
    M. Hiller, B. Mizaikoff, R. Kellner, W. Theiß, P. Grosse
    Mikrochim. Acta [Suppl.] 14 (1997), 283-285

  • Digging for light in semiconductor mines - infrared views of luminescent porous silicon
    W.Theiß
    Mikrochim. Acta [Suppl.] 14 (1997), 23-31 (invited)

  • Color-sensitive Si-photodiode using porous silicon interference filters
    M.Krüger, M.G.Berger, M.Marso, W.Reetz, T.Eickhoff, R.Loo, L.Vescan, M.Thönissen, H.Lüth, R.Arens-Fischer, S.Hilbrich, W.Theiß
    Jpn. J. Appl. Phys. 36 (1997), L24-L26

  • Optical interference filters made of porous silicon
    M. Thönissen, M.G. Berger, M. Krüger, S. Billat, R. Arens-Fischer, O. Glück, H. Lüth, S. Hilbrich, W. Theiß, P. Grosse
    Mat. Res. Soc. Symp. Proc., Vol. 431 (1996), 373-378

  • Illumination Assisted Formation of Porous Silicon
    M. Thönissen, M.G. Berger, R. Arens-Fischer, M. Krüger, O. Glück, H. Lüth, W. Theiß, M. Wernke
    Thin Solid Films, 276 (1996), 21-24

  • Microoptical Applications of Porous Silicon Superlattices
    M.Thönissen, M.G.Berger, M.Krüger, S.Billat, A.Loni, R.Arens-Fischer, H.Lüth, W.Theiß, S.Hilbrich, P.Grosse
    Proc. of the IEEE/LEOS Summer Topical Meeting, Keystone, ISBN 0-7803-3175-3 (1996), 47

  • Integration of porous silicon interference filters in Si-photodiodes
    M.Krüger, M.G.Berger, M.Marso, M.Thönissen, S.Hilbrich, W.Theiß, R.Loo, T.Eickhoff, W.Reetz, P.Grosse, H.Lüth
    Proceedings of the 26th European Solid State Device Research Conference, ISBN 2-86332-196-X

  • Advances in infrared spectroscopic methods for epitaxial film characterization
    R.A.Carpio, B.Fowler, W.Theiß
    SPIE Vol. 2638 (1996), 72-83

  • WIND – a radiation transfer program for simulating optical spectra of light scattering materials
    W.Theiß
    in ‘Electromagnetic and Light Scattering – Theory and Applications’, ed. by T.Wriedt, M.Quinten and K.Bauckhage, ISBN 3-88722-359-4 (1996), 79-82 (invited)

  • Formation of porous silicon on patterned substrates
    M. Krüger, R. Arens-Fischer, M.G.Berger, M.Thönissen, H.Münder, H. Lüth, S.Hilbrich, W.Theiß
    Thin Solid Films 276 (1996), 257-260

  • The influence of the doping level on the optical properties of porous silicon
    S.Hilbrich, W.Theiß, R.Arens-Fischer, M.G.Berger, O.Glück, M.Krüger
    Thin Solid Films 276 (1996), 231-234

  • The dielectric function of porous silicon - how to get it and how to use it
    W.Theiß,
    Thin Solid Films 276 (1996), 7-12, (invited)

  • Far infrared spectroscopy
    B.Harbecke, B.Heinz, W.Theiß, V.Offermann
    a chapter in “Optical characterization of epitaxial semiconductor layers“, G.Bauer, W.Richter (Eds.), (Springer Berlin Heidelberg 1996) (invited)

  • Microstructure and optical properties of plamapolymer thin films with embedded silver nanoparticles
    A.Heilmann, J.Werner, D.Schwarzenberg, S.Henkel, P.Grosse, W.Theiß
    Thin Solid Films 270 (1995), 103-108

  • Probing optical transitions in porous silicon by reflectance spectroscopy in the near infrared, visible and UV
    W. Theiß, M. Arntzen, M.Wernke,R. Arens-Fischer, M.G.Berger, S. Frohnhoff
    Mat. Res. Soc. Symp. Proc. 358 (1995), 435-440

  • Formation and properties of porous Si superlattices
    M.G.Berger, S.Frohnhoff, C.Dieker, R.Arens-Fischer, H.Münder, H.Lüth, M.Arntzen, W.Theiß
    Mat. Res. Soc. Symp. Proc. 358 (1995), 327-332

  • The Kramers-Kronig-Relation of Effective Dielectric Functions
    E.Gorges, P.Grosse, W.Theiß
    Z.Phys.B. - Condensed Matter 97 (1995), 49-54

  • Porous silicon: from single porous layers to superlattices
    M.G.Berger, S.Frohnhoff, W.Theiß, U.Rossow, H.Münder
    in Porous silicon science and technology, ed. by J.C.Vial, J.Derrien, Springer Verlag (Germany), Les Editions de Physique (France) (1995), 345-355 (invited)

  • IR spectroscopy of porous silicon
    W.Theiß
    in Porous silicon science and technology, ed. by J.C.Vial, J.Derrien, Springer Verlag (Germany), Les Editions de Physique (France) (1995),189-205 (invited)

  • From minutes to months: ageing of porous silicon single layers and superlattices
    W.Theiß, M.Arntzen, S.Hilbrich, M.Wernke, R.Arens-Fischer, M.G.Berger
    phys. stat. sol. (b) 190 (1995), 15-20

  • Characterization of supercritically dried porous silicon
    S.Frohnhoff, R.Arens-Fischer, T.Heinrich, J.Fricke, M.Arntzen, W.Theiß
    Thin Solid Films 255 (1995), 115-118

  • Investigation and design of optical properties of porosity superlattices
    M.G.Berger, S.Frohnhoff, R.Arens-Fischer, M.Thönissen, C.Dieker, H.Münder, H.Lüth, M.Arntzen, W.Theiß
    Thin Solid Films 255 (1995), 313-316

  • Connecting microscopic and macroscopic properties of porous media: choosing appropriate effective medium concepts
    W.Theiß, S.Henkel, M.Arntzen
    Thin Solid Films 255 (1995), 177-180

  • Depth profiling of porous silicon layers by ATR spectroscopy
    W.Theiß, M.Wernke, V.Offermann
    Thin Solid Films 255 (1995), 181-184

  • Investigation of porous Si superlattices by optical techniques
    H. Münder, M.G. Berger, C. Dieker, M. Thönissen, H. Lüth, W. Theiß, P. Grosse
    in Formation of semiconductor interfaces, Proc. 4th ICFSI, Editors, B. Lengeler, H. Lüth, W. Mönch, J. Pollmann, 736 (1994), World Scientific

  • Fabrication and properties of multilayer porous silicon filters
    M.G.Berger, S.Frohnhoff, R.Arens-Fischer, M.Thönissen, C.Dieker, H.Münder, H.Lüth, W.Theiß, M.Arntzen
    Proc. of the International Symposium on Optical Interference Coatings (SPIE), Grenoble 1994

  • A parameterization of the effective dielectric function of a two-phase composite medium
    E.Gorges, P.Grosse, J.Sturm, W.Theiß
    Z.Phys.B. - Condensed Matter

  • The use of effective medium theories in optical spectroscopy
    W.Theiß
    In Festkörperprobleme 33, ed. by R. Helbig (Vieweg, Braunschweig, Wiesbaden 1994), 149-176 (invited)

  • Porosity superlattices: a new class of Si heterostructures
    M.G.Berger, C.Dieker, M.Thönissen, L.Vescan, H.Lüth, H.Münder, W.Theiß, M.Wernke, P.Grosse
    J. Phys. D: Appl. Phys. 27 (1994), 1333-1336

  • FTIR-microspectroscopy of organic monolayers in transmission
    B.Mizaikoff, R.Kellner, K.Taga, W.Theiß, P.Grosse
    in 9th International Conference on Fourier Transform Spectroscopy, John E. Bertie, Hal Wieser, Editors, Proc. SPIE 2089, 164-165 (1993)

  • Porous silicon - a new material studied by IR spectroscopy
    W.Theiß, M.Arntzen, S.Facsko, M.Feuerbacher, M.Wernke, P.Grosse, H.Münder, M.Thönissen
    in 9th International Conference on Fourier Transform Spectroscopy, John E. Bertie, Hal Wieser, Editors, Proc. SPIE 2089, 176-177 (1993)

  • Characterisation of Porous Silicon Layers by Spectroscopic Ellipsometry
    U.Rossow, H.Münder, M.Thönissen, W.Theiß
    J. of Luminescence 57 (1993), 205

  • Infrared reflection studies of ceramics: characterization of SiC layers on graphite substrates
    V.Hopfe, W.Grählert, K.Brennfleck, E.H.Korte, W.Theiß
    Fresenius J. Anal. Chem. 346 (1993), 99-103

  • The influence of microelectronic processing steps on the properties of porous Si-layers
    H.Münder, M.G.Berger, S.Frohnhoff, M.Thönissen, H.Lüth, W.Theiß, L.Küpper
    in 'Optical Properties of Low Dimensional Silicon Structures’, ed. by D.C. Bensahel, L.T. Canham, S. Ossicini (Kluwer Academic Publ., Dordrecht, Boston, London 1993), 75

  • Characterization of porous silicon layers by reflectance spectroscopy
    W.Theiß, P.Grosse, H.Münder, H.Lüth, R.Herino, M.Ligeon
    Mat. Res. Soc. Symp. Proc. 238, 215 (1993)

  • Far infrared optical properties of metal-insulator composites
    J.Sturm, P.Grosse, S.Morley, W.Theiß
    Z.Phys.D. - Atoms, Molecules and Clusters 26 (1993), 195-197

  • FTIR-Microspectroscopic Detection of Ultra-thin Organic Films on Chalcogenide Fibers
    R.Kellner, B.Mizaikoff, K.Taga, W.Theiß, P.Grosse
    Fresenius J. Anal. Chem. 346 (1993), 612-614

  • Chemical composition of porous silicon layers studied by IR spectroscopy
    W.Theiß, P.Grosse, H.Münder, H.Lüth, R.Herino, M.Ligeon
    Applied Surface Science 63 (1993), 240-244

  • Determination of the effective dielectric function of silver powders produced by inert gas evaporation
    T.Eickhoff, P.Grosse, S.Henkel, W.Theiß
    Z.Phys.B. - Condensed Matter 88 (1992), 17-23

  • Optical characterization of porous silicon layers formed on heavily p-doped substrates
    H.Münder, C.Andrzejak, M.G.Berger, T.Eickhoff, H.Lüth, W.Theiß, U.Rossow, W.Richter, R.Herino, M.Ligeon
    Applied Surface Science 56-58 (1992), 6-10

  • Analysis of photoacoustic IR spectra of aerogel and silica powder
    H.Hövel, P.Grosse, W.Theiß
    Journal of Noncryst. Solids 145 (1992), 159-163

  • IR spectroscopy of porous silica gels
    M.Hornfeck, W.Theiß, R.Clasen
    Journal of Noncryst. Solids 145 (1992), 154-158

  • Seeing more looking at less - Applications of IR microscopy
    P.Grosse, L.Küpper, W.Theiß
    SPIE Vol. 1575 (1991), 269-270

  • IR-spectroscopical investigations on the glass structure of porous and sintered compacts of colloidal silica gels
    R.Clasen, M.Hornfeck, W.Theiß:
    SPIE Vol. 1513 (1991), 243-254

  • Effective dielectric functions of alkali halide composites and their spectral representation
    J.Sturm, P.Grosse, W.Theiß
    Z.Phys.B. - Condensed Matter 83 (1991), 361-365

  • Effective dielectric functions of samples obtained by evaporation of alkali halides
    J.Sturm, P.Grosse, W.Theiß
    Z.Phys.D. - Atoms, Molecules and Clusters 20 (1991), 341-343

  • Diffuse reflectance spectroscopy of powders
    T.Eickhoff, P.Grosse, W.Theiß
    Vibrational Spectroscopy 1 (1990), 229-233

  • Optics of two-phase composites
    M.Evenschor, P.Grosse, W.Theiß
    Vibrational Spectroscopy 1 (1990), 173-177