- 3 -
3D chart
- A -
About
Ag
angle
angle of incidence
angles of incidence
angular dependence
automatic fit
Autoscale
average
- B -
background susceptibility
backside
- C -
carrier concentration
charge
charge carriers
chemical symbols
coherent
concentration
conductivity
configuration
configuration file
constant
- D -
damping constant
data points
database
database grid
database window
deposition rate
depth profile
deviation
dielectric background
dielectric function
dielectric function list
Dielectric function model
dielectric function parameters
divergence
Doped silicon
doping
doping level
drag
drag&drop
Drude model
Drude susceptibility
- E -
effective mass
electron
electronic devices
epilayer
epilayer thickness
Excel 97
experimental data
- F -
file format
fit
fit parameter
fit parameters
Fitting parameters
free charge carriers
- G -
Glass
global range
Graphics
- H -
halfspace
Help&Manual
hypertext jumps
- I -
Import
impurity
incoherent
infared analysis
infrared
interface
interference
interference envelope
interference fringes
interference pattern
interference patterns
interpolation
IR
- L -
layer
layer parameters
layer stack
layer structure
layer thickness
list of dielectric functions
list of fit parameters
list of optical constants
list of simulated spectra
List properties
literature data
- M -
main window
Manual fitting
mass
measured spectrum
menu
microns
microscope slide
mobility
mouse button
multiphonon
- O -
OLE automation
optical constants
optical contrast
optimization
Overview
- P -
Parameter adjustment
parameter optimization
parameters of the computed spectra
partial waves
p-doped silicon
phase shift
plasma frequency
polarization
program configuration
- R -
Range
Range command
Recalc
recomputation
reflectance
Report
resistivity
resolution
rough backside
- S -
sample spot
sample structure
SCOUT configuration
semiconductor
semiconductors
silicon
silver
simple layer
simulated spectra
slider
sliders
spectra
SpectraCalc format
spectral range
spectrum list
spectrum type
sputtering
Sputtering rate
superposition
susceptibilities
susceptibility
susceptibility list
- T -
table
tables
technical manual
thickness
thickness variation
thickness vs. time relation
- U -
unit
Update
- V -
Vacuum
Visual fitting
VisualBasic
- W -
wafer backside